Referenced Items are not available for this document.
Intermittent faults, being serious concerns for deep-submicron integrated circuits, are not well studied in the literature. This paper performs fault injection simulation to analyze the impact of intermittent faults, which is an important step towards the development of mitigation techniques for such threats.
Published in:
Design & Test of Computers, IEEE
(Volume:29
,
Issue:
6
)
Date of Publication: Dec. 2012
- Page(s):
- 66 - 73
- ISSN :
- 0740-7475
- INSPEC Accession Number:
- 13448624
- Digital Object Identifier :
- 10.1109/MDT.2011.2179514
- Product Type:
- Journals & Magazines
- Date of Publication :
- 07 March 2013
- Date of Current Version :
- 17 April 2013
- Issue Date :
- Dec. 2012
- Sponsored by :
- IEEE Council on Electronic Design and Automation
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