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Experimental Verification of RF Stress Effect on Cascode Class-E PA Performance and Reliability

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9 Author(s)
Yuan, J.-S. ; Dept. of Electr. Eng. & Comput. Sci., Univ. of Central Florida, Orlando, FL, USA ; Hsuan-Der Yen ; Shuyu Chen ; Ruey-Lue Wang
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A cascode class-E power amplifier (PA) operating at 5.2 GHz has been designed using Advanced Design System simulation. RF circuit performances such as output power and power-added efficiency before and after RF stress have been experimentally investigated. The measured output power, power-added efficiency, and linearity after high-input-power RF stress at elevated supply voltage show significant circuit degradations. The impact of hot-carrier injection and gate oxide soft breakdown on cascode class-E PA reliability is discussed.

Published in:
Device and Materials Reliability, IEEE Transactions on  (Volume:12 ,  Issue: 2 )

Date of Publication: June 2012

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