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Quantitative measurement of in-plane cantilever torsion for calibrating lateral piezoresponse force microscopy

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A simple quantitative measurement procedure of in-plane cantilever torsion for calibrating lateral piezoresponse force microscopy is presented. This technique enables one to determine the corresponding lateral inverse optical lever sensitivity (LIOLS) of the cantilever on the given sample. Piezoelectric coefficient, d31 of BaTiO3 single crystal (-81.62 ± 40.22 pm/V) which was calculated using the estimated LIOLS was in good agreement with the reported value in literature.

Published in:

Review of Scientific Instruments  (Volume:82 ,  Issue: 11 )

Date of Publication:

Nov 2011

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