Cart (Loading....) | Create Account
Close category search window
 

High resolution permittivity reconstruction of one dimensional stratified dielectric media from broadband measurement data in the W-band

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
von Aschen, H. ; Dept. of Microwave Eng. & High Freq. Technol. (LHFT), Univ. of Erlangen-Nuremberg, Erlangen, Germany ; Gumbmann, F. ; Schmidt, L.

For many security or Non Destructive Testing (NDT) applications it is desirable to detect and reconstruct dielectric stratified media to classify the investigated device under test (DUT). With rotational invariance techniques like the matrix pencil method (MPM) it is possible to improve the parameter estimation of a harmonic signal in contrast to the classical FFT based methods. By applying a time gating procedure prior to the MPM it is possible to reduce the influence of noise and multipath signals. Hence an improved parameter estimation is possible. Based on an optimized layer stripping algorithm it is possible to overestimate the number of layers in the stratified media and combine approximately similar layers.

Published in:

Radar Conference (EuRAD), 2011 European

Date of Conference:

12-14 Oct. 2011

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.