Referenced Items are not available for this document.
The Application of Line-labeling algorithm to on-line defect detection system for printed-matter was studied in this paper and it was compared with Pixel Labeled Algorithm. The algorithm is based on the line between rows. Connected regions of defect were marked and their parameters (position, area, etc) were obtained rapidly by scan the full image only once, while the full image has to be scanned twice and an equivalent mark table has to be produced in Pixel Labeled Algorithm. Practical application shows that Line-labeling algorithm is more suitable for on-line defect detection system.
Published in:
Image and Signal Processing (CISP), 2011 4th International Congress on
(Volume:1
)
Date of Conference: 15-17 Oct. 2011
- Page(s):
- 310 - 313
- Print ISBN:
- 978-1-4244-9304-3
- INSPEC Accession Number:
- 12439094
- Conference Location :
- Shanghai
- Digital Object Identifier :
- 10.1109/CISP.2011.6100020
- Product Type:
- Conference Publications
About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies
A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.
