Cart (Loading....) | Create Account
Close category search window
 

Mapping of femtosecond laser-induced collateral damage by electron backscatter diffraction

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Kumar, Anish ; Department of Materials Science and Engineering, University of Michigan, Ann Arbor, Michigan 48109, USA ; Pollock, Tresa M.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.3653839 

The distribution of the collateral damage beneath craters produced by ultrafast (femtosecond) laser single pulses in a nickel base superalloy single crystal has been analyzed using electron backscatter diffraction. The procedure is based on measurements of the localized crystal rotations caused by the dislocations generated by the shock wave that is produced as an effect of laser pulse interaction with a material. Damage in the form of lattice misorientation created by excess dislocations was negligible at laser fluences up to 2 J/cm2. At higher fluences (5.1-41 J/cm2), the depth of the damage zone beneath the crater increased linearly with laser fluence. Based on lattice misorientation, excess dislocation densities as high as 3 × 1010/cm2 are calculated to be present below the ablated surface in the high fluence regime.

Published in:

Journal of Applied Physics  (Volume:110 ,  Issue: 8 )

Date of Publication:

Oct 2011

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.