Close category search window
 

A general technique to correct probe position errors in planar near-field measurements to arbitrary accuracy

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Muth, L.A. ; US Dept. of Commerce, Boulder, CO, USA ; Lewis, R.L.

A general theoretical procedure is presented to remove known probe-position errors when planar near-field data are transformed to the far field. The measured data are represented as a Taylor series whose terms contain the error function and the ideal spectrum of the antenna. This representation is then assumed to be an actual near-field existing on an error-free regularly spaced two-dimensional scan plane. By inverting the Taylor series, the ideal spectrum in terms of the measured data and the position errors is obtained. The solution is given by an infinite series of an error operator acting on data containing errors of measurement. This error operator is the Taylor series without the zeroth-order term. The nth order approximation to the ideal near-field of the antenna can be explicitly constructed by inspection of the structure of the error operator. Convergence of the approximation is examined. Computer simulations are used to demonstrate the excellent results obtained with this technique, as well as to demonstrate the convergence of the error-corrected fields to the true solution

Published in:
Antennas and Propagation, IEEE Transactions on  (Volume:38 ,  Issue: 12 )

Date of Publication: Dec 1990

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.