By Topic

Energy harvesting properties of all-thin-film multiferroic cantilevers

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

The purchase and pricing options are temporarily unavailable. Please try again later.
4 Author(s)
Onuta, Tiberiu-Dan ; Department of Materials Science and Engineering, University of Maryland, College Park, Maryland 20742, USA ; Wang, Yi ; Long, Christian J. ; Takeuchi, Ichiro

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.3662037 

We have measured electromagnetic energy harvesting properties of all-thin-film magnetoelectric (ME) heterostructures on Si cantilevers. The devices are built on a silicon oxide/nitride/oxide stack, and the ME layers consist of a magnetostrictive Fe0.7Ga0.3 thin film and a Pb(Zr0.52Ti0.48)O3 piezoelectric thin film. The harvested peak power at 1 Oe is 0.7 mW/cm3 (RMS) at the resonant frequency (3.8 kHz) with a load of 12.5 kΩ. The resonant frequency was found to display DC bias magnetic field dependence indicative of a magnetization canting with respect to the cantilever easy axis as a result of interplay between the anisotropy and Zeeman energies.

Published in:

Applied Physics Letters  (Volume:99 ,  Issue: 20 )