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Influence of N-Well Contact Area on the Pulse Width of Single-Event Transients

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9 Author(s)
Ahlbin, J.R. ; Vanderbilt Univ., Nashville, TN, USA ; Atkinson, N.M. ; Gadlage, M.J. ; Gaspard, N.J.
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Heavy-ion broadbeam results from a 90 nm process are presented for five inverter chains with varying n-well contact schemes. Results show that inverters with the smallest percentage of n-well contact area within an n-well produced the longest and most frequent single-event transients (SETs). As the percentage of n-well area contacted increases above 2%, the pulse width and number of SETs levels-off. A result indicating an optimized percentage of n-well area contacted can be calculated that minimizes the pulse width and number of SETs in a digital circuit.

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Nuclear Science, IEEE Transactions on  (Volume:58 ,  Issue: 6 )