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Monitoring and Tuning Micro-Ring Properties Using Defect-Enhanced Silicon Photodiodes at 1550 nm

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6 Author(s)
Logan, D.F. ; Dept. of Eng. Phys., McMaster Univ., Hamilton, ON, Canada ; Velha, P. ; Sorel, M. ; De La Rue, R.M.
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We report on the application of defect-enhanced silicon waveguide photodiodes operating at 1550 nm as power monitors for use in photonic integrated circuits. In-line monitors of 250-μm length provide an efficiency of 97 mA/W by absorbing only 8% of the optical mode. The monitors were integrated onto micro-ring waveguide ports to provide measures of optical resonance characteristics and a feedback to a thermal resonance tuner. The suitability of these photodetectors for control of micro-ring resonators is demonstrated.

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Photonics Technology Letters, IEEE  (Volume:24 ,  Issue: 4 )