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Predicting the Single-Event Error Rate of a Radiation Hardened by Design Microprocessor

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10 Author(s)
Cabanas-Holmen, M. ; Boeing Co. Seattle, Seattle, WA, USA ; Cannon, E.H. ; Amort, T. ; Ballast, J.
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We describe the approach used to calculate and verify on-orbit upset rates of radiation hardened microprocessors. System designers use these error rates to choose between microprocessors and add appropriate system-level recovery and redundancy.

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Nuclear Science, IEEE Transactions on  (Volume:58 ,  Issue: 6 )