Referenced Items are not available for this document.
We describe the approach used to calculate and verify on-orbit upset rates of radiation hardened microprocessors. System designers use these error rates to choose between microprocessors and add appropriate system-level recovery and redundancy.
Published in:
Nuclear Science, IEEE Transactions on
(Volume:58
,
Issue:
6
)
Date of Publication: Dec. 2011
- Page(s):
- 2726 - 2733
- ISSN :
- 0018-9499
- INSPEC Accession Number:
- 12408907
- Digital Object Identifier :
- 10.1109/TNS.2011.2168978
- Product Type:
- Journals & Magazines
- Date of Publication :
- 18 November 2011
- Date of Current Version :
- 12 December 2011
- Issue Date :
- Dec. 2011
- Sponsored by :
- IEEE Nuclear and Plasma Sciences Society
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