Cart (Loading....) | Create Account
Close category search window

A Rigorous Solution to the Low-Frequency Breakdown in Full-Wave Finite-Element-Based Analysis of General Problems Involving Inhomogeneous Lossless/Lossy Dielectrics and Nonideal Conductors

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Jianfang Zhu ; Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA ; Dan Jiao

Existing methods for solving the low-frequency breakdown problem associated with full-wave solvers rely on low-frequency approximations, which has left a number of research questions to be answered. The conductors are also generally treated as perfect conductors and the dielectric loss is not considered. In this work, a rigorous method that does not utilize low-frequency approximations is developed to eliminate the low frequency breakdown problem for the full-wave finite-element based analysis of general 3-D problems involving inhomogeneous lossless and/or lossy dielectrics and nonideal conductors. This method has been validated by the analysis of realistic on-chip circuits at frequencies as low as dc. Furthermore, it is applicable to both low and high frequencies. In this method, the frequency dependence of the solution to Maxwell's equations is explicitly and rigorously derived from dc to high frequencies. In addition to eliminating the low-frequency breakdown, such a theoretical model of the frequency dependence can be used to understand how the field solution, in a complicated 3-D problem with both lossless/lossy inhomogeneous dielectrics and nonideal conductors, should scale with frequency and at which frequency full-wave effects become important.

Published in:

Microwave Theory and Techniques, IEEE Transactions on  (Volume:59 ,  Issue: 12 )

Date of Publication:

Dec. 2011

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.