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Extension of the SUNRED algorithm for electrothermal simulation and its application in failure analysis of large area (organic) semiconductor devices

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2 Author(s)
László Pohl ; Budapest University of Technology and Economics (BME), Department of Electron DevicesB wing, Building Q, BME, Magyar tudósok körútja 2., Budapest, Hungary, 1117 ; Ernő Kollár

The Finite Differences Method (FDM) based Successive Network Reduction (SUNRED) algorithm is a fast and accurate distributed electro-thermal simulation method for microelectronic applications. A presented new extension can handle the Seebeck and the Peltier-Thomson effects. Organic Light-Emitting Diodes (OLEDs) are thin-film multilayer devices based on organic molecules or polymers. These devices are not only used as displays but they appear in intelligent lighting applications. The article introduces temperature-dependent OLED luminance modeling based on measurements and application of the models in the SUNRED algorithm to gain luminance maps. Because of the operational degradation of the OLED, non-emissive “dark” spots can appear. Cause of these spots can be e.g. manufacturing problem, damage of the surface protection, etc. Electro-thermal and luminance simulation of this failure type is demonstrated and is compared with measured results. Non-uniform light emitting polymer layer thickness or high current flux can cause the thermal runaway of the device; these effects are presented by DC and transient simulations.

Published in:

Thermal Investigations of ICs and Systems (THERMINIC), 2011 17th International Workshop on

Date of Conference:

27-29 Sept. 2011