Cart (Loading....) | Create Account
Close category search window
 

Field-Emission Characteristics of Zinc Oxide Nanowires Using Low-Temperature Supercritical Carbon Dioxide Fluid Method

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Yang, Po-Yu ; Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan ; Agarwal, S. ; Huang-Chung Cheng

Single-crystalline ZnO nanowires (NWs) were directly grown on Zn/glass substrates by using a low-temperature (i.e., 40°C) supercritical carbon dioxide (SCCO2) fluid method. The optical, physical, and field-emission (FE) characteristics of the SCCO2 -synthesized ZnO nanostructures are systematically investigated. ZnO NWs exhibited the low turn-on field of 3.16 V/μm at a current density of 10 μA/cm2 and a low threshold field of 4.38 V/μm at a current density of 1 mA/cm2. The current fluctuation of ZnO emitters was less than 8% at 5.3 V/μm in 12 h. The excellent FE properties of SCCO2-synthesized ZnO emitters at low temperature make them a superior candidate for FE-based display devices.

Published in:

Electron Device Letters, IEEE  (Volume:33 ,  Issue: 1 )

Date of Publication:

Jan. 2012

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.