Cart (Loading....) | Create Account
Close category search window

Statistical Analysis of the Current-Sharing Temperature Evolution in \hbox {Nb}_{3}\hbox {Sn} Cable-in- Conduit-Conductors for ITER

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Uglietti, D. ; EPFL-CRPP, Fusion Technol., Villigen, Switzerland ; Wesche, R. ; Stepanov, B. ; Bruzzone, P.

During the test of ITER conductors at nominal conditions, a degradation of the current sharing temperature has been observed after electromagnetic cyclic loading. Rather than focusing on the microscopic phenomena at the origin of the degradation, the degradation process has been studied from a statistical point of view, analysing the whole dataset of ITER conductors: average degradations have been calculated after various cycle numbers. Possible correlation with the strand critical current has also been analysed. In order to model the evolution of has been correlated with the reliability against cracks formation; the reliability is in turn defined according to a two parameters Weibull distribution. The validity of this approach has been tested with the so-called “Weibull plot”. The Weibull exponents were calculated for several ITER conductors and were found to be lower than one, indicating that the failure rate, which may be regarded as the formation rate of fractures in the filaments composing the strands, is decreasing with the number of cycles.

Published in:

Applied Superconductivity, IEEE Transactions on  (Volume:22 ,  Issue: 3 )

Date of Publication:

June 2012

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.