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Implementation and analysis of probabilistic methods for gate-level circuit reliability estimation

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3 Author(s)
Wang, Zhen ; Key Laboratory of Embedded Systems and Service Computing, Ministry of Education of Shanghai 201804. Department of Computer Science and Technology, Tongji University, Shanghai 201804, China ; Jiang, Jianhui ; Yang, Guang

The development of VLSI technology results in the dramatically improvement of the performance of integrated circuits. However, it brings more challenges to the aspect of reliability. Integrated circuits become more susceptible to soft errors. Therefore, it is imperative to study the reliability of circuits under the soft error. This paper implements three probabilistic methods (two pass, error propagation probability, and probabilistic transfer matrix) for estimating gate-level circuit reliability on PC. The functions and performance of these methods are compared by experiments using ISCAS85 and 74-series circuits.

Published in:

Tsinghua Science and Technology  (Volume:12 ,  Issue: S1 )

Date of Publication:

July 2007

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