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Deterministic circular self test path

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3 Author(s)
Wen, Ke ; Key Laboratory of Computer System and Architecture, Institute of Computing Technology, Chinese Academy of Sciences, Beijing 100080, China; Graduate School of Chinese Academy of Sciences, Beijing 100080, China ; Hu, Yu ; Li, Xiaowei

Circular self test path (CSTP) is an attractive technique for testing digital integrated circuits(IC) in the nanometer era, because it can easily provide at-speed test with small test data volume and short test application time. However, CSTP cannot reliably attain high fault coverage because of difficulty of testing random-pattern-resistant faults. This paper presents a deterministic CSTP (DCSTP) structure that consists of a DCSTP chain and jumping logic, to attain high fault coverage with low area overhead. Experimental results on ISCAS'89 benchmarks show that 100% fault coverage can be obtained with low area overhead and CPU time, especially for large circuits.

Published in:

Tsinghua Science and Technology  (Volume:12 ,  Issue: S1 )