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Electric field enhancement within moulded samples of low density polyethene-a means of failure characterised by voltage ramp tests and space charge measurement

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2 Author(s)
J. M. Alison ; King's Coll., London, UK ; L. A. Dissado

The work reported here presents evidence that the stress enhancing factor operating is that of a space charge hetero-field which enhances the applied field at the electrode up to a value of ~1 MV/mm, which is sufficient to cause `intrinsic' breakdown in polyethene. Here, breakdown would be caused by the effective elimination of the barrier to charge injection, causing a destructive injection current. This mechanism would also be consistent with the `wormhole' breakdown structures typically observed for majority of ramp failures in the region of characteristic field

Published in:

Dielectric Materials, Measurements and Applications, Seventh International Conference on (Conf. Publ. No. 430)

Date of Conference:

23-26 Sep 1996