Scheduled System Maintenance on May 29th, 2015:
IEEE Xplore will be upgraded between 11:00 AM and 10:00 PM EDT. During this time there may be intermittent impact on performance. We apologize for any inconvenience.
By Topic

New algorithm of target classification in polarimetric SAR

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Yang, Wang ; Key Lab of Intelligent Computing & Signal Processing of Ministry of Education, Anhui Univ., Heifei 230039, P. R. China The 38th Research Inst., China Electronic Technology Corporation, Hefei 230031, P. R. China ; Jiaguo, Lu ; Xianliang, Wu

The different approaches used for target decomposition (TD) theory in radar polarimetry are reviewed and three main types of theorems are introduced: those based on Mueller matrix, those using an eigenvector analysis of the coherency matrix, and those employing coherent decomposition of the scattering matrix. Support vector machine (SVM), as a novel approach in pattern recognition, has demonstrated success in many fields. A new algorithm of target classification, by combining target decomposition and the support vector machine, is proposed. To conduct the experiment, the polarimetric synthetic aperture radar (SAR) data are used. Experimental results show that it is feasible and efficient to target classification by applying target decomposition to extract scattering mechanisms, and the effects of kernel function and its parameters on the classification efficiency are significant.

Published in:

Systems Engineering and Electronics, Journal of  (Volume:19 ,  Issue: 2 )