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Bayesian synthetic evaluation of multistage reliability growth with instant and delayed fix modes

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4 Author(s)
Yan Zhiqiang ; Coll. of Mechatronic Engineering and Automation, National Univ. of Defense Technology, Changsha 410073, P. R. China ; Li Xinxin ; Xie Hongwei ; Jiang Yingjie

In the multistage reliability growth tests with instant and delayed fix modes, the failure data can be assumed to follow Weibull processes with different parameters at different stages. For the Weibull process within a stage, by the proper selection of prior distribution form and the parameters, a concise posterior distribution form is obtained, thus simplifying the Bayesian analysis. In the multistage tests, the improvement factor is used to convert the posterior of one stage to the prior of the subsequent stage. The conversion criterion is carefully analyzed to determine the distribution parameters of the subsequent stage's variable reasonably. Based on the mentioned results, a new synthetic Bayesian evaluation program and algorithm framework is put forward to evaluate the multistage reliability growth tests with instant and delayed fix modes. The example shows the effectiveness and flexibility of this method.

Published in:

Journal of Systems Engineering and Electronics  (Volume:19 ,  Issue: 6 )