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Total Ionizing Dose Versus Displacement Damage Dose Induced Dark Current Random Telegraph Signals in CMOS Image Sensors

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8 Author(s)
Virmontois, C. ; ISAE, Univ. de Toulouse, Toulouse, France ; Goiffon, V. ; Magnan, P. ; Saint-Pe, O.
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Dark current Random Telegraph Signals due to total ionizing dose (TID) and displacement damage dose (DDD) are investigated in CMOS image sensors. Discrepancies between both RTS are emphasised to better understand the microscopic origins of the phenomena.

Published in:

Nuclear Science, IEEE Transactions on  (Volume:58 ,  Issue: 6 )

Date of Publication:

Dec. 2011

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