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Secondary electron emission (SEE) is one of the main parameters controlling spacecraft potential. It also plays an important role in the triggering of the multipactor phenomenon occurring in waveguides (electron avalanche in microwave electric fields). In this paper, we propose an original method adapted to low-energy SEE measurements on dielectrics and conductors (incident electron energy below 20 eV). It is based on Kelvin probe (KP) surface potential measurements after electron irradiation. It is particularly well suited to insulating materials but can also be used on metals by letting the sample potential float. We present results of SEE measurements performed on metals used in waveguides, Kapton, Teflon, and CMX cover glass. In order to avoid any experimental artifact due to the earth magnetic field and conduct accurate low-energy measurements with the KP method, the distance between the electron gun and the sample is chosen to be negligible compared to the Larmor radius.