By Topic

Design and reliability evaluation of passive HF RFID systems in metal environments

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
D'hoe, K. ; DraMCo Res. Group, Catholic Univ. Coll. Ghent, Ghent, Belgium ; Hamelinckx, T. ; Goemaere, J.-P. ; Stevens, N.
more authors

In spite of the popularity of passive Radio Frequency Identification (RFID) systems, reliability is an important topic to achieve the adoption of this technology in certain areas of applications. Maintaining this reliability is especially challenging in applications where metals are ubiquitous. This article describes how a passive HF RFID system is optimized for implementation within a closed metal case. The ideal orientation of a transponder within a metal environment is determined. Various simulations were executed in order to predict the areas where the magnetic field exceeded the activation field of the tags. The findings, resulting from these simulations, are verified by hardware measurements which show high prediction accuracy for the practical test setup. In this paper we optimized the reliability of RFID systems by adjusting the radius of a circular loop antenna to the metal construction. In future work, the simulation and measurement tools presented here will be used to evaluate and, eventually automatically generate, optimal antennas with other (non-circular) shapes for different environments.

Published in:

RFID-Technologies and Applications (RFID-TA), 2011 IEEE International Conference on

Date of Conference:

15-16 Sept. 2011