Cart (Loading....) | Create Account
Close category search window
 

Test Framework Generation for Model-Based Testing in Embedded Systems

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Iyenghar, P. ; Software Eng. Res. Group, Univ. of Osnabrueck, Osnabruck, Germany

Model Driven Development (MDD) and Model-Based Testing (MBT) are slowly replacing the traditional methods of developing and testing real-time embedded software systems (RTESS). However, even though MBT finds wide applicability in various fields, none of the existing approaches deals with generating test artifacts for deploying MBT in the RTESS. This paper discusses an algorithm for test framework generation and deploying online MBT in RTESS. A novel test framework generation algorithm is introduced which, given the design model (representing the requirements of an RTESS) and a System Under Test (SUT), generates a test framework which comprises of the necessary artifacts to perform MBT in RTESS. The discussed approach eliminates the need for dynamic source code instrumentation for executing the test stimuli in the embedded target. A prototype implementation of the test framework generation algorithm is discussed along with an illustrative example. An empirical comparison between the existing and the proposed approach is provided.

Published in:

Software Engineering and Advanced Applications (SEAA), 2011 37th EUROMICRO Conference on

Date of Conference:

Aug. 30 2011-Sept. 2 2011

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.