Cart (Loading....) | Create Account
Close category search window
 

A test bench for accelerated thermal ageing of III–V concentration solar cells using forward bias injection

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Immovilli, F. ; DISMI, Univ. of Modena & Reggio Emilia, Modena, Italy ; Bianchini, C. ; Bellini, A. ; Sala, A.

Power production from solar photovoltaic systems is constantly increasing. In the last few years concentration photovoltaic (CPV) system using III-V multijunction cells appeared on the market, promising doubled efficiencies compared to traditional silicon PV solar panels. For CPV systems to be competitive on the market, they must be reliable to assure long-term operation. This paper presents the design and construction of a test bench for thermal cycling characterization of dense array receivers employing III-V multijunction cells mounted on a microchannel heat sink. Instead of a climatic chamber, the proposed test bench employs forward bias injection (FBI) to heat the cells, in order to better mimic on-field operating conditions. The experimental results of the accelerated ageing test are coherent with preliminary on-field trials, with a good agreement on the fault mechanism.

Published in:

Energy Conversion Congress and Exposition (ECCE), 2011 IEEE

Date of Conference:

17-22 Sept. 2011

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.