By Topic

On the Susceptibility of Embedded Thermal Shutdown Circuit to Radio Frequency Interference

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Aiello, O. ; Dept. of Electron., Politec. di Torino, Torino, Italy ; Fiori, F.

This paper deals with the susceptibility to RF interference of a temperature sensor used in smart power system-on-chip to shut down the source of heat or the overall device in the case of overtemperature. Such a sensor is usually buried within the power section; hence, it is parasitically coupled with the power transistors and for this reason its operation can be affected by the disturbances superimposed onto the power transistors' nominal signals. In this work, the detrimental effect of the RF interference on a common thermal shutdown circuit is analyzed using an approximate nonlinear model and performing time-domain computer simulations. The results of these analyses show that RF interference can induce false fault signaling. To avoid this, a simple and effective layout solution that improves the immunity of such kind of circuits is proposed and its effectiveness is proved by experimental test results.

Published in:

Electromagnetic Compatibility, IEEE Transactions on  (Volume:54 ,  Issue: 2 )