Cart (Loading....) | Create Account
Close category search window
 

Exposure Compliance Methodologies for Multiple Input Multiple Output (MIMO) Enabled Networks and Terminals

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Perentos, N. ; Swinburne Univ. of Technol., Hawthorn, VIC, Australia ; Iskra, S. ; Faraone, A. ; McKenzie, R.J.
more authors

Multiple input multiple output (MIMO) enabled handsets and base-stations feature antenna systems that generate electromagnetic fields for which relevant exposure standards and guidelines do not explicitly define compliance testing methodologies. Here, through computational modeling, we explore several field summation schemes for evaluating such exposures and propose compliance testing methodologies that limit the degree of exposure under/over-estimation for both base stations and handsets. The methodologies rely on scalar field probe measurements thus avoiding significant equipment upgrades and are applicable to cases where access to signals from each MIMO antenna element can be arranged.

Published in:

Antennas and Propagation, IEEE Transactions on  (Volume:60 ,  Issue: 2 )

Date of Publication:

Feb. 2012

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.