Cart (Loading....) | Create Account
Close category search window
 

Development of a SIFT based monocular EKF-SLAM algorithm for a small unmanned aerial vehicle

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Suzuki, T. ; Adv. Res. Inst. for Sci. & Eng., Waseda Univ., Tokyo, Japan ; Amano, Y. ; Hashizume, T.

This paper describes a simultaneous localization and mapping (SLAM) algorithm using a monocular camera for a small unmanned aerial vehicle (UAV). A small U AV is attracted the attention for effective means of the collecting aerial information. However, there are few practical applications due to its small payloads for the 3D measurement. We propose extended Kalman filter (EKF) SLAM to increase UAV position and attitude data and to construct 3D terrain maps using a small monocular camera. We propose 3D measurement based on scale-invariant feature transform (SIFT) triangulation features extracted from captured images. Field-experiment results show that our proposal effectively estimates U AV position and attitude of the U AV and construct the 3D terrain map.

Published in:

SICE Annual Conference (SICE), 2011 Proceedings of

Date of Conference:

13-18 Sept. 2011

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.