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Shmoo plotting: the black art of IC testing

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2 Author(s)
Baker, K. ; Philips Res. Lab., Eindhoven, Netherlands ; Van Beers, J.

Obtaining higher yields from IC fabrication is a never ending goal. Toward that end, shmoo plotting can help bridge the gap between design and test and ultimately show ways to improve a product, process, or manufacturing test program

Published in:

Design & Test of Computers, IEEE  (Volume:14 ,  Issue: 3 )