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IC failure analysis: the importance of test and diagnostics

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1 Author(s)
D. P. Vallett ; IBM Corp., Essex Junction, VT, USA

Continuous improvements in yield, reliability, time to market, and customer satisfaction all benefit from quick corrective action through root-cause failure analysis. The author reviews software- and hardware-based diagnostic methods for fault localization, the first and most critical step in this process

Published in:

IEEE Design & Test of Computers  (Volume:14 ,  Issue: 3 )