Cart (Loading....) | Create Account
Close category search window
 

Diagnosing IC failures in a fast environment

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Staab, D. ; Tandem Comput. Inc., Cupertino, CA, USA ; Hnatek, E.R.

In today's world of fast product introductions, short product life cycles, and complex ICs, manufacturers need comprehensive, accurate, and fast diagnosis of development failures and reliability hazards before launching a product. As a result, the failure analyst's role has changed from reactive to proactive. Waiting until failures come back from the field to assess the reliability of a product is no longer efficient. By that time it's too late. Devising tests that anticipate all failure modes and accelerating those failures within a reasonable length of time is also impractical if not impossible. There are too many variables and too many unknowns in the equation to use this shotgun approach. It results in too many reliability tests that produce no failures, and failure rates that too often are calculated on the basis of potentially irrelevant tests. To adequately evaluate the reliability of a component, the proactive failure analyst must first closely inspect it for both physical and electrical hazards. Combining this data with field data from products using the same technology, the analyst can run realistic tests that stress the part to failure, thus deriving an appropriate failure rate. The proactive failure analyst's role is to detect failures before they occur and assist the circuit designer in eliminating their cause before the product ships. This means that the analyst must conduct evaluation testing with an eye toward the physics of component failure. The result is improved manufacturing yield and a more robust, more reliable component in the field

Published in:

Design & Test of Computers, IEEE  (Volume:14 ,  Issue: 3 )

Date of Publication:

Jul-Sep 1997

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.