By Topic

The economics of system-level testing

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Farren, D. ; Eur. Cellular Infrastructure Div., Motorola Inc., Cork, Ireland ; Ambler, Tony

Competitive pressure to streamline system-level test without affecting product quality is mounting. Identifying the features unique to system-level testing, the authors present key results of production testing based on a new test cost model

Published in:

Design & Test of Computers, IEEE  (Volume:14 ,  Issue: 3 )