Close category search window
 

A hybrid model for the control and the analysis of complex automated warehouse systems

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Basile, F. ; Dip. Ing. Elettron. e Ing. Inf., Univ. di Salerno, Salerno, Italy ; Chiacchio, P. ; Coppola, J.

An automated warehouse system has two main components: an automated storage and retrieval subsystem consisting of a number of aisles, each one served by a crane, and a picking area which is formed by bays where stock units coming from the aisles are partially emptied by human operators. These two components are connected via an interface area consisting of carousels, conveyors and buffers. This area is usually modeled as a discrete event system, while the overall system performance depends also on continuous time phenomena. A hybrid model focusing on the interface area is proposed in this paper to improve the control and the analysis of complex automated warehouse systems. A real case study is considered to show the effectiveness of the approach.

Published in:
Emerging Technologies & Factory Automation (ETFA), 2011 IEEE 16th Conference on

Date of Conference: 5-9 Sept. 2011

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.