Cart (Loading....) | Create Account
Close category search window
 

Ontology-guided knowledge discovery of event sequences in maintenance data

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Schuh, M. ; Dept. of Comput. Sci., Montana State Univ., Bozeman, MT, USA ; Sheppard, J. ; Strasser, S. ; Angryk, R.
more authors

We created an application that facilitates improved knowledge discovery from aircraft maintenance data by transforming transactional database records into ontology-based event graphs, and then providing a filterable visualization of event sequences through time. We developed OWL ontologies based on formally defined IEEE standards, and use these ontologies to guide the data mining and data transformation processes. Our application removes much of the users burden for data look-up and greatly increases the potential for knowledge discovery from data (KDD) in this field. We provide an easy-to-use interface that generates relevant sequences of data in a meaningful context in a fraction of the time it would take domain experts to retrieve and display similar information.

Published in:

AUTOTESTCON, 2011 IEEE

Date of Conference:

12-15 Sept. 2011

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.