Cart (Loading....) | Create Account
Close category search window
 

Effects of exposure to intermediate frequency magnetic fields on gene expression of estrogen-regulated gene in MCF-7 cells

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

7 Author(s)
Ogasawara, Y. ; Meiji Pharm. Univ., Kiyose, Japan ; Ikehata, M. ; Sakaguchi, R. ; Awakura, S.
more authors

To evaluate biological effects of intermediate frequency magnetic fields (IF-MF), estrogen-regulated gene expression under magnetic fields were studied. Genetically modified MCF-7 cells that transformed with ERE-luc fusion gene was used. Cells which endogenous estrogen depleted by estrogen free media are exposed to 21 kHz IF-MF for 24 hr. Then, luciferase activity was measured as estrogen-regulated gene expression. In this study, we have observed no significant difference in luciferase activity between exposed and sham-exposed cells by exposure to up to 3.9mT, 21 kHz IF-MF for 24hr. These results suggest that IF-MF is unlikely to affect directly on estrogen-regulated gene expression.

Published in:

General Assembly and Scientific Symposium, 2011 XXXth URSI

Date of Conference:

13-20 Aug. 2011

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.