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Systematic spatial errors in SMOS brightness temperature images are successfully estimated by using a statistical analysis of measured data. A constant multiplicative mask is derived by averaging spatial errors of a large number of snapshots over the ocean. The mask has been obtained for the alias- free field of view region without the need of any geophysical model. It can be considered as part of the instrument characterization and is totally independent of the target to measure. When this mask is applied to regular SMOS brightness temperatures, the spatial artifacts are clearly reduced.