By Topic

A novel active learning strategy for domain adaptation in the classification of remote sensing images

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Persello, C. ; Dept. of Inf. Eng. & Comput. Sci., Univ. of Trento, Trento, Italy ; Bruzzone, L.

We present a novel technique for addressing domain adaptation problems in the classification of remote sensing images with active learning. Domain adaptation is the important problem of adapting a supervised classifier trained on a given image (source domain) to the classification of another similar (but not identical) image (target domain) acquired on a different area, or on the same area at a different time. The main idea of the proposed approach is to iteratively labeling and adding to the training set the minimum number of the most informative samples from target domain, while removing the source-domain samples that does not fit with the distributions of the classes in the target domain. In this way, the classification system exploits already available information, i.e., the labeled samples of source domain, in order to minimize the number of target domain samples to be labeled, thus reducing the cost associated to the definition of the training set for the classification of the target domain. Experimental results obtained in the classification of a hyperspectral image confirm the effectiveness of the proposed technique.

Published in:

Geoscience and Remote Sensing Symposium (IGARSS), 2011 IEEE International

Date of Conference:

24-29 July 2011