Scheduled System Maintenance:
Some services will be unavailable Sunday, March 29th through Monday, March 30th. We apologize for the inconvenience.
By Topic

Electrical characterization and application of very high speed vertical cavity surface emitting lasers (VCSELs)

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Hietala, V.M. ; Sandia Nat. Labs., Albuquerque, NM, USA ; Lear, K.L. ; Armendariz, M.G. ; Tigges, C.P.
more authors

Vertical Cavity Surface Emitting Lasers (VCSELs) offer many benefits over conventional edge-emitting lasers including economical microelectronic batch processing, easy extension to 2-D arrays, and of interest here, very large intrinsic bandwidths due to reduced cavity volume. Results of electrical characterization of a 19 GHz bandwidth 850 nm VCSEL are presented. Small-signal characterization and modeling of the frequency response and device impedance is presented. Large signal performance is studied using two-tone RF and high-speed digital measurements. Appropriate drive conditions for high-speed digital applications are demonstrated.

Published in:

Microwave Symposium Digest, 1997., IEEE MTT-S International  (Volume:1 )

Date of Conference:

8-13 June 1997