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Arcing and voltage breakdown in vacuum microelectronics microwave devices using field emitter arrays: causes and possible solutions

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1 Author(s)
Charbonnier, F. ; Linfield Res. Inst., McMinnville, OR, USA

Summary form only given. We review briefly the differences between conventional and microelectronics devices which impact field emitter array (FEA) performance. We then review recent progress and state of the art FEA performance, analyze a number of possible causes of failure and suggest methods, particularly coating FEAs with refractory carbides, in order to stabilize FEAs and achieve prolonged arc free operation at increased current level.

Published in:

Plasma Science, 1997. IEEE Conference Record - Abstracts., 1997 IEEE International Conference on

Date of Conference:

19-22 May 1997