Cart (Loading....) | Create Account
Close category search window
 

Active Curve Recovery of Region Boundary Patterns

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Ben Salah, M. ; Dept. of Comput. Sci., Univ. of Alberta, Edmonton, AB, Canada ; Ben Ayed, I. ; Mitiche, A.

This study investigates the recovery of region boundary patterns in an image by a variational level set method which drives an active curve to coincide with boundaries on which a feature distribution matches a reference distribution. We formulate the scheme for both the Kullback-Leibler and the Bhattacharyya similarities, and apply it in two conditions: the simultaneous recovery of all region boundaries consistent with a given outline pattern, and segmentation in the presence of faded boundary segments. The first task uses an image-based geometric feature, and the second a photometric feature. In each case, the corresponding curve evolution equation can be viewed as a geodesic active contour (GAC) flow having a variable stopping function which depends on the feature distribution on the active curve. This affords a potent global representation of the target boundaries, which can effectively drive active curve segmentation in a variety of otherwise adverse conditions. Detailed experimentation shows that the scheme can significantly improve on current region and edge-based formulations.

Published in:

Pattern Analysis and Machine Intelligence, IEEE Transactions on  (Volume:34 ,  Issue: 5 )

Date of Publication:

May 2012

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.