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For efficient calibration of electronic instruments, we need to improve the general accepted approaches by introducing an automatic system with a properly defined calibration procedure, thus freeing people from tedious, time consuming calibration process. This paper present a design method for automatic calibration system based on dynamic loading testing subroutines and dynamic scheduling hardware. Dynamic loading technology is seriously depending on uniform interface definition, and which can make the system more open and easier to maintenance and update. Dynamic scheduling technology can improve the calibration efficiency greatly in the case of more than one device under test (DUTs). In the last of paper, a system developed for some type of RF instruments is shown as a development example.