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Three-dimensional technology offers greater device integration, reduced signal delay and reduced interconnect power. It also provides greater design flexibility by allowing heterogeneous integration. However, 3D technology exacerbates the on-chip thermal issues and increases packaging and cooling costs. In this work, a 3D thermal model of a stacked network-on-chip system is developed and thermal analysis is performed in order to analyze different job allocation and scheduling schemes using finite element simulations. The steady-state heat transfer analysis on the 3D stacked structure has been performed. We have analyzed the effect of variation of die power consumption, with and without hotspots, on peak temperatures in different layers of the stack. The optimal die placement solution is also provided based on the maximum temperature attained by the individual silicon dies.
Date of Conference: Aug. 31 2011-Sept. 2 2011