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Browse Conference Publications > Lasers and Electro-Optics, 19 ... Help

Examination of domain-reversed layers in Z-cut LiNbO3 using maker fringe analysis, atomic force microscopy, and high-resolution X-ray diffraction imaging

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8 Author(s)
Aust, J.A. ; National Institute of Standards and Technology ; Steiner, B. ; Sanford, N.A. ; Fogarty, G.
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First Page of the Article

Published in:
Lasers and Electro-Optics, 1997. CLEO '97., Summaries of Papers Presented at the Conference on  (Volume:11 )

Date of Conference: 18-23 May 1997

Page(s):
485 - 486
Print ISBN:
0-7803-4125-2
Conference Location :
Baltimore, MD, USA
Digital Object Identifier :
10.1109/CLEO.1997.603480
Product Type:
Conference Publications

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