Cart (Loading....) | Create Account
Close category search window

Study on the characteristics of partial discharges in voids under square voltage by detecting light emission intensity

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

7 Author(s)
Kai Wu ; State Key Lab. of Electr., Xi''an Jiaotong Univ., Xi''an, China ; Cheng Pan ; Yongpeng Meng ; Changhao Sun
more authors

In order to quantitatively study partial discharge (PD) behavior in voids under square voltage, the feasibility of PD measurement by detection of light emission intensity was investigated at first. Experiments were carried out to study the influences of void size on the correlation between light emission intensity and PD magnitude and its transition with PD degradation. It is confirmed that a good correlation existed between light emission intensity and PD magnitude in a void with diameter larger than 3mm and the correlation did not change in the PD degradation process. Then, the effect of square voltage rise rate on PD characteristics under square voltage was investigated by detecting light emission intensity. In the PD degradation process, an abnormal phenomenon that the maximum PD magnitude decreased with the increase of voltage rise rate was observed. This was interpreted in terms of the change of surface condition due to PD degradation.

Published in:

Dielectrics and Electrical Insulation, IEEE Transactions on  (Volume:18 ,  Issue: 5 )

Date of Publication:

October 2011

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.