Close category search window
 

Full counting statistics of one and two-electron systems in the presence of external gaussian white noise

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Amiri, M. ; Department of Physics, Shahid Beheshti University, G. C. Evin, Tehran 19839, Iran ; Ebrahimi, F.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.3639286 

In this paper, we consider the effects of external gaussian white noise on the full counting statistics (FCS) of non-interacting coherent electrons in mesoscopic systems. We first, derive the wave packet formalism of FCS in the presence of time dependent random potential. We then determine the steady state probability distributions of all the moments and cumulants of particle currents, specially, the shot-noise, the Fano factor, and the distribution in the noise-charge plane by numerically solving the stochastic time dependent Schrödinger equation (STDSE) for one and two-electron systems with transparent boundary conditions, using Numerov extension of Crank-Nicolson method.

Published in:
Journal of Applied Physics  (Volume:110 ,  Issue: 6 )

Date of Publication: Sep 2011

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.