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Microstructural Characterization of La- and Ti-Codoped Multiferroic BiFeO _{3} Epitaxial Thin Films

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4 Author(s)
Yi Yu ; Dept. of Mater. Sci. & Eng., Tsinghua Univ., Beijing, China ; Xiaozhong Zhang ; Qianping Chen ; Yonggang Zhao

La- and Ti-codoped multiferroic BiFeO3 (BLFTO) epitaxial thin films were grown on (001) SrTiO3 (STO) substrates by pulsed laser deposition (PLD) technique. The microstructure of BLFTO thin film had been intensively studied by using transmission electron microscopy (TEM). It was found that La-and Ti-codoping can reduce leakage current and improve ferroelectric behavior of BiFeO3 without changing its structure. The correlation of microstructure with electrical property is discussed.

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Magnetics, IEEE Transactions on  (Volume:47 ,  Issue: 10 )