Microstructural Characterization of La- and Ti-Codoped Multiferroic BiFeO$_{3}$ Epitaxial Thin Films

La- and Ti-codoped multiferroic BiFeO
₃
(BLFTO) epitaxial thin films were grown on (001) SrTiO
₃
(STO) substrates by pulsed laser deposition (PLD) technique. The microstructure of BLFTO thin film had been intensively studied by using transmission electron microscopy (TEM). It was found that La-and Ti-codoping can reduce leakage current and improve ferroelectric behavior of BiFeO
₃
without changing its structure. The correlation of microstructure with electrical property is discussed.