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Micromagnetic Specification for Bit Patterned Recording at 4 Tbit/in ^{2}

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2 Author(s)
Yan Dong ; Electr. & Comput. Eng. Dept., Univ. of Minnesota, Minneapolis, MN, USA ; Victora, R.H.

Micromagnetic specifications including 2.3:1 BAR bit patterned ECC media, trailing shield, and side shields are proposed to meet the requirement of 3 × 10-4 bit error rate, 4 nm fly height, 5% switching field distribution, 5% timing, and 5% jitter errors for 4 Tbit/in2 bit patterned recording. Demagnetizing field distribution is examined by studying the shielding effect of the side shields on the stray field from the neighboring dots. It is shown that, as the fly height is increased to 5 nm, head field and field gradient degradation will require a larger BAR (2.7:1) and a larger bit error rate to achieve the same areal density.

Published in:

Magnetics, IEEE Transactions on  (Volume:47 ,  Issue: 10 )