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Microstructures and Magnetic Properties of {\rm CoPt{-}SiN}_{x} {-}{\rm Ag} Granular Thin Films With Ag Underlayer

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6 Author(s)
Shen, C.L. ; Inst. of Mater. Sci. & Eng., Nat. Taiwan Univ., Taipei, Taiwan ; Kuo, P.C. ; Kuo, C.T. ; Lin, G.P.
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When the Ag layer was introduced under the CoPt alloy film which annealed at 700°C, the CoPt/Ag films had large out-of-plane squareness (S), out-of-plane coercivity (Hc⊥), and saturation magnetization (Ms). They were 0.95, 1432 kA/m, and 390 emu/cm3, respectively. Further, the SiNx ceramic materials were cosputtered with CoPt on the Ag underlayer at room temperature and then annealed to reduce the grain size of CoPt films. From the field-emission gun high-resolution transmission electron microscope analysis, the particle size of CoPt was about 10 nm as the SiNx content was 46.2 vol.%. Furthermore, Ag was added into the CoPt-SiNx films to reduce the transformation temperature of CoPt films from face-centered-cubic to face-centered-tetragonal structure.

Published in:

Magnetics, IEEE Transactions on  (Volume:47 ,  Issue: 10 )

Date of Publication:

Oct. 2011

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