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A new approach to thermometer-to-binary encoder of flash ADCs- bubble error detection circuit

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8 Author(s)
Bui Van Hieu ; Dept. of Electron. Eng., Myongji Univ., Yongin, South Korea ; Seunghwan Choi ; Jongkug Seon ; Youngcheol Oh
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In this paper, we propose a new approach to thermometer-to-binary encoder of Flash ADCs. Instead of integrating bubble error correction circuit as previous approaches, proposed approach integrates a bubble error detection circuit. The advantage of this approach is that it can handle all types of bubble error whereas previous approaches often deal with first-order bubble error only. Simulation results show that the bubble error detection circuit consumes very little energy.

Published in:
Circuits and Systems (MWSCAS), 2011 IEEE 54th International Midwest Symposium on

Date of Conference: 7-10 Aug. 2011

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